Kowa LM15FC-R 15mm C-Mount Industrial Lens – 1.1" Format, 24MP, IR-Corrected, 2.5µm Pixel, Radiation-Resistant Glass, Visible to NIR (400–1000nm)

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The Kowa LM15FC-R is a high-resolution 1.1" C-mount industrial lens engineered for 24MP camera systems with 2.5µm pixel sensors. Featuring a 15mm fixed focal length and advanced IR-corrected optics, this precision lens delivers sharp, high-contrast imaging across the visible to near-infrared spectrum (400–1000nm). It supports demanding applications requiring ultra-fine detail and edge-to-edge clarity, with a resolution of 200 lp/mm at the center and 125 lp/mm at the margins. TV distortion is tightly controlled at -2.12% for image integrity.

Designed to endure extreme environments, the LM15FC-R uses a radiation-resistant glass to prevent discoloration over time, making it ideal for critical imaging in security, industrial, and scientific fields. The lens provides manual focus control from 0.1m to infinity and operates within a wide temperature range of -10°C to +50°C. Lightweight at only 70g, its compact design is well-suited for integration into space-sensitive systems. This model features a patented construction for durability and consistency in high-performance imaging.

Features:

• Patented design with radiation-resistant glass preventing discoloration
• Fixed 15mm focal length optimized for 1.1" sensors (17.6mm diameter)
• Supports up to 24MP resolution with 2.5µm pixel size
• IR-corrected optics covering 400–1000nm wavelength range (visible to NIR)
• Manual focus control from 0.1m to infinity
• High optical resolution: 200 lp/mm center, 125 lp/mm margin
• Minimal TV distortion (-2.12%) for image accuracy
• Operational temperature range: -10°C to +50°C
• Compact and lightweight (70g), C-mount interface

Applications:

• Industrial machine vision and quality inspection
• Scientific imaging and research applications
• Security and surveillance with IR imaging needs
• Harsh environments with radiation exposure
• Automation and robotics vision systems
• Near-infrared imaging for material analysis